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ICT solution
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  • A:Full service with all device tupes and complexities
  • B:Custom solutions
  • C:Model development
  • Specializing in all aspects of boundary scan
    --BSDL
    --Complex chains
    --Silicon Nails testing
  • Static and variable device programming
    -FLASH.EPROM CPLD.PIC.Real Time
  • F:Creative solutions for switching power supplies
  • G:High coverage solutions on limited access products
  • H:ICT--based functional test solutions
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